Thorlabs0.39 NA TECS包層多模光纖

產(chǎn)品型號：
更新時(shí)間：2023-12-19
產(chǎn)品介紹：Thorlabs0.39 NA TECS包層多模光纖
我們很高興地再次為用戶介紹由3M™公司研發(fā)、Thorlabs公司生產(chǎn)的這款熱銷的技術(shù)改良包層石英（TECS）多模光纖。這些0.39NA低羥基或高羥基的硬質(zhì)包層石英多模光纖在可見光到近紅外（對于低羥基光纖為400 - 2200 nm）或紫外到近紅外（對于高羥基光纖為300 - 1200 nm）波長范圍具有出色的性能和透射率。
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產(chǎn)品介紹

品牌	Thorlabs	價(jià)格區(qū)間	面議
組件類別	光學(xué)元件	應(yīng)用領(lǐng)域	電子

Thorlabs0.39 NA TECS包層多模光纖

Thorlabs0.39 NA TECS包層多模光纖特性

低羥基和高羥基版本的光纖用于不同光譜范圍

高羥基版用于300 - 1200 nm

低羥基版用于400 - 2200 nm

硬質(zhì)包層石英纖芯多模光纖

TECS硬質(zhì)含氟聚合物包層可以保證耐久性和潮濕環(huán)境中具有低靜態(tài)疲勞特性

我們很高興地再次為用戶介紹由3M™公司研發(fā)、Thorlabs公司生產(chǎn)的這款熱銷的技術(shù)改良包層石英(TECS)多模光纖。這些0.39NA低羥基或高羥基的硬質(zhì)包層石英多模光纖在可見光到近紅外(對于低羥基光纖為400 - 2200 nm)或紫外到近紅外(對于高羥基光纖為300 - 1200 nm)波長范圍具有出色的性能和透射率。

這些光纖具有一層TECS包層，可以增大光纖的強(qiáng)度，減小靜態(tài)疲勞，并在剝光纖時(shí)起到保護(hù)作用。石英與TECS包層的強(qiáng)力邊界可以防止光纖在包層中滑動(dòng)，并提供更加穩(wěn)定的末端。這些光纖極其適合光譜學(xué)、光遺傳學(xué)和內(nèi)科診斷學(xué)等應(yīng)用。TECS包層可以用丙酮進(jìn)行清除。

Stock Patch Cables Available with these Fibers
Item #	Fiber Used	Description	Length
M38	FT200EMT	SMA to SMA	1 or 2 m
M72		FC/PC to FC/PC	1, 2, or 5 m
M75		SMA to FC/PC	1 or 2 m
M83		FC/PC to Ø1.25 mm Ferrule End	1 m
M81		FC/PC to Ø2.5 mm Ferrule End	0.5 or 1 m
M89		SMA to Ø1.25 mm Ferrule End	1 m
M77		SMA to Ø2.5 mm Ferrule End	0.5 or 1 m
BFY200LS02		SMA to SMA Bifurcated Bundle	2 m
BFY200MS02		SMA to SMA Bifurcated Bundle	2 m
BFY200HS02	FT200UMT	SMA to SMA Bifurcated Bundle	2 m
BFY200MS02	FT200UMT	SMA to SMA Bifurcated Bundle	2 m
M69	FT300EMT	FC/PC to FC/PC	1, 2, or 5 m
M12		FC/PC to SMA	1 or 2 m
M56		FC/PC to Ø2.5 mm Ferrule End	0.5 or 1 m
M58		SMA to Ø2.5 mm Ferrule	0.5 or 1 m
M28	FT400EMT	SMA to SMA	1, 2, or 5 m
M74		FC/PC to FC/PC	1, 2, or 5 m
M76		FC/PC to SMA	1 or 2 m
M82		FC/PC to Ø2.5 mm Ferrule End	0.5 or 1 m
M79		SMA to Ø2.5 mm Ferrule	0.5 or 1 m
BFY400LS02		SMA to SMA Bifurcated Bundle	2 m
BFY400MS02		SMA to SMA Bifurcated Bundle	2 m
BFY400HS02	FT400UMT	SMA to SMA Bifurcated Bundle	2 m
BFY400MS02	FT400UMT	SMA to SMA Bifurcated Bundle	2 m

Alternate Numerical Aperture Step-Index Fibers
0.1 NA High-Power, Small-Core Fibers	0.22 NA High- and Low-OH Fibers	0.39 NA High- and Low-OH Fibers	0.48/0.50 NA High- and Low-OH Fibers

規(guī)格

Item #	Wavelength Range	Hydroxyl Content	Core Diameter	Cladding Diameter	Coating Diameter	Core / Cladding	Coating	Proof Test	Stripping Tool
FT200UMT	300 - 1200 nm	High OH	200 ± 5 μm	225 ± 5 μm	500 ± 30 μm	Pure Silica / TECS™ Hard Cladding	Tefzel	≥100 kpsi	T12S21
FT200EMT	400 - 2200 nm	Low OH
FT300UMT	300 - 1200 nm	High OH	300 ± 6 μm	325 ± 10 μm	650 ± 30 μm				T16S31
FT300EMT	400 - 2200 nm	Low OH
FT400UMT	300 - 1200 nm	High OH	400 ± 8 μm	425 ± 10 μm	730 ± 30 μm				T21S31
FT400EMT	400 - 2200 nm	Low OH
FT600UMT	300 - 1200 nm	High OH	600 ± 10 μm	630 ± 10 μm	1040 ± 30 μm				T28S46
FT600EMT	400 - 2200 nm	Low OH
FT800UMT	300 - 1200 nm	High OH	800 ± 10 µm	830 ± 10 µm	1040 ± 30 µm				M37S46
FT800EMT	400 - 2200 nm	Low OH
FT1000UMT	300 - 1200 nm	High OH	1000 ± 15 μm	1035 ± 15 μm	1400 ± 50 μm				M44S63
FT1000EMT	400 - 2200 nm	Low OH
FT1500UMT	300 - 1200 nm	High OH	1500 ± 30 μm	1550 ± 31 μm	2000 ± 100 μm				M63S86
FT1500EMT	400 - 2200 nm	Low OH

Ø200 µm纖芯TECS包層多模光纖，0.39NA

Item #	Wavelength Range	Hydroxyl Content	Core Diameter	Cladding Diameter	Coating Diameter	Core / Cladding	Coating	Stripping Tool	Proof Test
FT200UMT	300 - 1200 nm	High OH	200 ± 5 µm	225 ± 5 µm	500 ± 30 µm	Pure Silica / TECS Hard Cladding	Tefzel	T12S21	≥100 kpsi
FT200EMT	400 - 2200 nm	Low OH

Item #	NA	Core Index	Cladding Index	Maximum Attenuation @ 808 nm	Bandwidth @ 820 nm	Max Power Capability		Max Core Offset	Bend Radius		Operating Temperature
						Pulsed	CW		Short Term	Long Term
FT200UMT	0.39	436 nm: 1.466757 589.3 nm: 1.458434 1020 nm: 1.450174	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	14 dB/km	20 MHz•km	1.0 MW	0.2 kW	5 µm	9 mm	18 mm	-65 - 135 °C
FT200EMT		436 nm: 1.467287 589.3 nm: 1.458965 1020 nm: 1.450703	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	10 dB/km

產(chǎn)品型號	公英制通用
FT200UMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑200 µm，高羥基，300 - 1200 n
FT200EMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑200 µm，低羥基，400 - 2200 nm

Ø300 µm纖芯TECS包層多模光纖，0.39 NA

Item #	Wavelength Range	Hydroxyl Content	Core Diameter	Cladding Diameter	Coating Diameter	Core / Cladding	Coating	Stripping Tool	Proof Test
FT300UMT	300 - 1200 nm	High OH	300 ± 6 µm	325 ± 10 µm	650 ± 30 µm	Pure Silica / TECS Hard Cladding	Tefzel	T16S31	≥100 kpsi
FT300EMT	400 - 2200 nm	Low OH

Item #	NA	Core Index	Cladding Index	Maximum Attenuation @ 808 nm	Bandwidth @ 820 nm	Max Power Capability		Max Core Offset	Bend Radius		Operating Temperature
						Pulsed	CW		Short Term	Long Term
FT300UMT	0.39	436 nm: 1.466757 589.3 nm: 1.458434 1020 nm: 1.450174	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	14 dB/km	15 MHz•km	2.3 MW	0.5 kW	5 µm	11 mm	22 mm	-65 - 135 °C
FT300EMT		436 nm: 1.467287 589.3 nm: 1.458965 1020 nm: 1.450703	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	10 dB/km

產(chǎn)品型號	公英制通用
FT300UMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑300 µm，高羥基，300 - 1200 nm
FT300EMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑300 µm，低羥基，400 - 2200 nm

Ø400 µm纖芯TECS包層多模光纖，0.39 NA

Item #	Wavelength Range	Hydroxyl Content	Core Diameter	Cladding Diameter	Coating Diameter	Core / Cladding	Coating	Stripping Tool	Proof Test
FT400UMT	300 - 1200 nm	High OH	400 ± 8 µm	425 ± 10 µm	730 ± 30 µm	Pure Silica / TECS Hard Cladding	Tefzel	T21S31	≥100 kpsi
FT400EMT	400 - 2200 nm	Low OH

Item #	NA	Core Index	Cladding Index	Maximum Attenuation @ 808 nm	Bandwidth @ 820 nm	Max Power Capability		Max Core Offset	Bend Radius		Operating Temperature
						Pulsed	CW		Short Term	Long Term
FT400UMT	0.39	436 nm: 1.466757 589.3 nm: 1.458434 1020 nm: 1.450174	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	14 dB/km	13 MHz•km	4.0 MW	0.8 kW	7 µm	20 mm	40 mm	-65 - 135 °C
FT400EMT		436 nm: 1.467287 589.3 nm: 1.458965 1020 nm: 1.450703	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	10 dB/km

產(chǎn)品型號	公英制通用
FT400UMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑400 µm，高羥基，300 - 1200 nm
FT400EMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑400 µm，低羥基，400 - 2200 nm

Ø600 µm纖芯TECS包層多模光纖，0.39 NA

Item #	Wavelength Range	Hydroxyl Content	Core Diameter	Cladding Diameter	Coating Diameter	Core / Cladding	Coating	Stripping Tool	Proof Test
FT600UMT	300 - 1200 nm	High OH	600 ± 10 µm	630 ± 10 µm	1040 ± 30 µm	Pure Silica / TECS Hard Cladding	Tefzel	T28S46	≥100 kpsi
FT600EMT	400 - 2200 nm	Low OH

Item #	NA	Core Index	Cladding Index	Maximum Attenuation @ 808 nm	Bandwidth @ 820 nm	Max Power Capability		Max Core Offset	Bend Radius		Operating Temperature
						Pulsed	CW		Short Term	Long Term
FT600UMT	0.39	436 nm: 1.466757 589.3 nm: 1.458434 1020 nm: 1.450174	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	12 dB/km	9 MHz•km	9.0 MW	1.8 kW	9 µm	30 mm	60 mm	-65 - 135 °C
FT600EMT		436 nm: 1.467287 589.3 nm: 1.458965 1020 nm: 1.450703	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	10 dB/km

產(chǎn)品型號	公英制通用
FT600UMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑600 µm，高羥基，300 - 1200 nm
FT600EMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑600 µm，低羥基，400 - 2200 nm

Ø800 µm纖芯TECS包層多模光纖，0.39 NA

Item #	Wavelength Range	Hydroxyl Content	Core Diameter	Cladding Diameter	Coating Diameter	Core / Cladding	Coating	Stripping Tool	Proof Test
FT800UMT	300 - 1200 nm	High OH	800 ± 10 µm	830 ± 10 µm	1040 ± 30 µm	Pure Silica / TECS Hard Cladding	Tefzel	M37S46	≥100 kpsi
FT800EMT	400 - 2200 nm	Low OH

Item #	NA	Core Index	Cladding Index	Maximum Attenuation @ 808 nm	Bandwidth @ 820 nm	Max Power Capability		Max Core Offset	Bend Radius		Operating Temperature
						Pulsed	CW		Short Term	Long Term
FT800UMT	0.39	436 nm: 1.466757 589.3 nm: 1.458434 1020 nm: 1.450174	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	12 dB/km	N/A	16.0 MW	3.2 kW	9 µm	40 mm	80 mm	-65 - 135 °C
FT800EMT		436 nm: 1.467287 589.3 nm: 1.458965 1020 nm: 1.450703	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	10 dB/km

產(chǎn)品型號	公英制通用
FT800UMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑800 µm，高羥基，300 - 1200 nm
FT800EMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑800 µm，低羥基，300 - 1200 nm

Ø1000 µm纖芯TECS包層多模光纖，0.39 NA

Item #	Wavelength Range	Hydroxyl Content	Core Diameter	Cladding Diameter	Coating Diameter	Core / Cladding	Coating	Stripping Tool	Proof Test
FT1000UMT	300 - 1200 nm	High OH	1000 ± 15 µm	1035 ± 15 µm	1400 ± 50 µm	Pure Silica / TECS Hard Cladding	Tefzel	M44S63	≥100 kpsi
FT1000EMT	400 - 2200 nm	Low OH

Item #	NA	Core Index	Cladding Index	Maximum Attenuation @ 808 nm	Bandwidth @ 820 nm	Max Power Capability		Max Core Offset	Bend Radius		Operating Temperature
						Pulsed	CW		Short Term	Long Term
FT1000UMT	0.39	436 nm: 1.466757 589.3 nm: 1.458434 1020 nm: 1.450174	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	12 dB/km	N/A	25.1 MW	5.0 kW	10 µm	50 mm	100 mm	-65 - 135 °C
FT1000EMT		436 nm: 1.467287 589.3 nm: 1.458965 1020 nm: 1.450703	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	10 dB/km

產(chǎn)品型號	公英制通用
FT1000UMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑1000 µm，高羥基，300 - 1200 nm
FT1000EMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑1000 µm，低羥基，400 - 2200 nm

Ø1500 µm纖芯TECS包層多模光纖，0.39 NA

Item #	Wavelength Range	Hydroxyl Content	Core Diameter	Cladding Diameter	Coating Diameter	Core / Cladding	Coating	Stripping Tool	Proof Test
FT1500UMT	300 - 1200 nm	High OH	1500 ± 30 µm	1550 ± 31 µm	2000 ± 100 µm	Pure Silica / TECS Hard Cladding	Tefzel	M63S86	≥100 kpsi
FT1500EMT	400 - 2200 nm	Low OH

Item #	NA	Core Index	Cladding Index	Maximum Attenuation @ 808 nm	Bandwidth @ 820 nm	Max Power Capability		Max Core Offset	Bend Radius		Operating Temperature
						Pulsed	CW		Short Term	Long Term
FT1500UMT	0.39	436 nm: 1.466757 589.3 nm: 1.458434 1020 nm: 1.450174	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	18 dB/km	N/A	56.6 MW	11.3 kW	15 µm	75 mm	150 mm	-65 - 135 °C
FT1500EMT		436 nm: 1.467287 589.3 nm: 1.458965 1020 nm: 1.450703	436 nm: 1.406000 589.3 nm: 1.398200 1020 nm: 1.392306	18 dB/km

產(chǎn)品型號	公英制通用
FT1500UMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑1500 µm，高羥基，300 - 1200 nm
FT1500EMT	TECS硬質(zhì)包層多模光纖，數(shù)值孔徑0.39，芯徑1500 µm，低羥基，400 - 2200 nm